专利名称：METHOD AND DEVICE FOR MEASURING
INTERNAL INFORMATION OF SCATTERINGABSORBER
发明人：TSUCHIYA, Yutaka, Hamamatsu Photonics
K.K.
申请号：EP99954411.7申请日：19991105公开号：EP1136811A1公开日：20010926
专利附图：
摘要：A method and a device for measuring internal information of a scattering
absorber, wherein a pulsed light with a plurality of specified wavelengths or a modulatedlight with a plurality of specified frequencies is shone into a scattering absorber (1) to bemeasured from a light source (5), an outgoing light is detected by a photodetector (7),and then internal information is operated and calculated by a signal processing unit (8)and a processing unit (9), whereby internal information of the scattering absorber isobtained by calculating an absorption coefficient difference, by a spectroscopic
measuring method (MVS method) using an optical path length average and dispersion orequivalent physical quantities and by utilizing an MBL low-based time-resolved
integration measuring (TIS) method and a phase modulation measuring (PMS) method tothereby enable high-accuracy, high-speed measurement of internal information of ascattering absorber (1).
申请人：Hamamatsu Photonics K.K.
地址：1126-1, Ichino-cho, Hamamatsu-shi Shizuoka-ken 435-8558 JP
国籍：JP
代理机构：Whitten, George Alan
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